Spatial resolution measurement of triple-GEM detector and diffraction imaging test at synchrotron radiation

Zhang, Y. L.; Qi, Hongxing; Wen, Zhengqi; Wang, Hai; Ouyang, Q.; Chen, YB; Zhang, J.; Hu, Bitao

doi:10.1088/1748-0221/12/04/p04015

Cited by 4 publications

(5 citation statements)

References 27 publications

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“…It is necessary to do a further study to understand the result obtained from this measure and if it really brings some relevant information for this field of science. Diffraction patterns have already been observed with GEM detectors and we expected something closer to the one published in [2].…”

Section: Study Of Crystalssupporting

confidence: 84%

“…One of the future applications of the detector can be in crystallography studies in diffraction mode [2]. Figure 9.1 shows a setup tested during the elaboration of this work, used to irradiate a nickel oxide sample.…”

Section: Study Of Crystalsmentioning

confidence: 99%

“…Since the discovery of X-rays by Wilhelm Conrad Röntgen [1], many applications were developed by science and industry involving this type of radiation. Due to the high cross section for interactions with electrons, it is possible to apply X-ray techniques in crystallography [2], transmission imaging in medicine and spectroscopy analysis that can be used in industry, geology and archaeology. Many other applications were found regarding cultural heritage studies [3], high energy physics and homeland security.…”

Section: Introductionmentioning

confidence: 99%

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X-Ray fluorescence imaging system based on Thick-GEM detectors

Souza¹

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AgradecimentosEste trabalho recebeu apoio financeiro da Fundação de Amparo à Pesquisa do Estado de São Paulo, com a bolsa FAPESP 2017/00426-9.My sincere thanks to the whole GDD lab at CERN, in special Leszek Ropelewski, Eraldo Oliveri, Patrik Thuiner and Florian Brunbauer.Gostaria de agradecer primeiramente ao professor Alexandre Suaide, por me introduzir ao grupo e pela ajuda nos mais diversos assuntos. À professora Marcia Rizzuto e à minha amiga Hellen Santos, pelo interesse nesse trabalho e troca de informações.Aos professores Marco Bregant, Marcelo Munhoz, Nelson Carlin, Tiago Fiorini, Mauro Cosentino e Zwinglio Guimarães pelas ideias e sugestões, tornando esse trabalho muito mais completo.Ao meu orientador e amigo, Hugo Natal da Luz, pelos ensinamentos, conselhos e paciência. Aos amigos que fiz durante a graduação e o mestrado, pela diversão, aprendizado e companhia durante todos esse anos. Um agradecimento especial aos amigos do grupo, Henrique, Milton, Camila, Chiara, Thais e Lucas. À minha familia, meus pais, Marco Aurélio e Maria Cabrine, e meu irmão Ramon, por toda confiança e suporte. Vocês são os melhores exemplos para mim. À Mayumi, pelo carinho e por estar ao meu lado nos melhores e piores momentos."All we have to decide is what to do with the time that is given us." -J.R.R. Tolkien, The Lord of The Rings Abstract GEMs (Gas Electron Multiplier) and Thick-GEMs (Thick-Gas Electron Multiplier) are MPGDs (Micropattern Gas Detector) that make part of the new generation of gaseous detectors, allowing high counting rates, low cost when compared to solid state detectors, high radiation hardness and gain when using multiple structures. Besides that, the handling and maintenance of these detectors is relatively simple, being versatile to detect different types of radiation. Therefore, these detectors are an effective alternative to build imaging systems with large sensitive area. This work consists in the study and characterization of a set of gaseous detectors, more specifically the Thick-GEMs produced in the High Energy Physics and Instrumentation Center at IFUSP, which were tested showing promising results in terms of gain, energy resolution and operational stability. However, due to the low signal-to-noise ratio of the Thick-GEMs, the X-ray fluorescence imaging system was mounted using GEMs. During this work the necessary software tools for image processing and reconstruction were developed as a parallel study in computational simulations to better understand the operation of gaseous detectors.X-ray fluorescence techniques are essential in areas such as medicine and the study of historical and cultural heritage since they are non-invasive and non-destructive. Techniques to check the authenticity of masterpieces are required and museums are gradually becoming more interested in the Physics and instrumentation needed to characterize their patrimony.

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Section: Study Of Crystalssupporting

confidence: 84%

Section: Study Of Crystalsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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X-Ray fluorescence imaging system based on Thick-GEM detectors

Souza¹

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“…When aiming at the best possible energy resolution, approaching the physical limits due to fluctuations of the generated charge, one has to pay attention to other effects, namely, variation in the gas amplification factor across the detector and dependence of the gas amplification factor on the radiation intensity. In the literature, one can find very different numbers on the energy resolution of GEM detectors from 18% to 27% FWHM for X-ray energy of 5.9 keV [ 37 , 38 , 39 , 40 ]. The energy at the level of 18% FWHM is usually measured using a focused X-ray beam so that the gas amplification factor is constant over a small examined area of the detector.…”

Section: Methodsmentioning

confidence: 99%

Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer

Łach

Fiutowski

Koperny

et al. 2021

Sensors

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The goal of the work was to investigate the possible application of factor analysis methods for processing X-ray Fluorescence (XRF) data acquired with a full-field XRF spectrometer employing a position-sensitive and energy-dispersive Gas Electron Multiplier (GEM) detector, which provides only limited energy resolution at a level of 18% Full Width at Half Maximum (FWHM) at 5.9 keV. In this article, we present the design and performance of the full-field imaging spectrometer and the results of case studies performed using the developed instrument. The XRF imaging data collected for two historical paintings are presented along with the procedures applied to data calibration and analysis. The maps of elemental distributions were built using three different analysis methods: Region of Interest (ROI), Non-Negative Matrix Factorisation (NMF), and Principal Component Analysis (PCA). The results obtained for these paintings show that the factor analysis methods NMF and PCA provide significant enhancement of selectivity of the elemental analysis in case of limited energy resolution of the spectrometer.

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“…At the same time, several studies have been made with different GEM detector configurations to achieve the requirements of the experiments. These have produced very promising results in terms of high rate radiation measurements, low discharge probability, low ion back flow (IBF), excellent position and energy resolutions as well as good time resolution [5,7,8,9]. GEM detectors are seen to be suitable for a long time stable operation without any appreciable aging in high radiation environment [7,10,11].…”

Section: Introductionmentioning

confidence: 99%

Characteristic study of a quadruple GEM detector and its comparison with a triple GEM detector

Patra

Singaraju

Biswas

et al. 2018

Nuclear Instruments and Methods in Physics Research Section A:

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A quadruple GEM detector has been assembled in a standalone configuration and operated using Ar and CO 2 gas mixtures in proportions of 70:30 and 90:10. Detailed performance study of the detector has been made by using 106 Ru-Rh β-source and X-ray spectrum of 55 Fe source. Results of these measurements are presented in terms of gain, efficiency, energy and time resolutions and also compared with our earlier triple GEM results. The energy resolution has been found to be somewhat worse compared with that of the triple-GEM detector. Effect of drift field on electron transparency and time resolution has been studied in detail.

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Spatial resolution measurement of triple-GEM detector and diffraction imaging test at synchrotron radiation

Cited by 4 publications

References 27 publications

X-Ray fluorescence imaging system based on Thick-GEM detectors

X-Ray fluorescence imaging system based on Thick-GEM detectors

Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer

Characteristic study of a quadruple GEM detector and its comparison with a triple GEM detector

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