2019
DOI: 10.1021/acsaelm.8b00128
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Spatially Precise Transfer of Patterned Monolayer WS2 and MoS2 with Features Larger than 104 μm2 Directly from Multilayer Sources

Abstract: A current challenge in the processing of 2D materials, or “van der Waals (vdW) solids”, is the transfer of 2D layers from source crystals and growth substrates onto target substrates. Transferas opposed to direct growth and patterning on the targetenables low-temperature processing of the target as well as the use of diverse target materials. These two attributes will allow the assembly of vdW heterostructures to realize devices exploiting the unique properties of vdW materials. Until now, however, there has… Show more

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Cited by 29 publications
(27 citation statements)
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“…S6). Rough surfaces resembling nanoparticles scattered on the material have also been observed previously on monolayer features that had undergone energetic and extended O2 plasma cleaning before the Au etch [30]. In that case, X-ray photoelectron spectroscopy suggested that some Au remained on the surface after cleaning [30].…”
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confidence: 72%
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“…S6). Rough surfaces resembling nanoparticles scattered on the material have also been observed previously on monolayer features that had undergone energetic and extended O2 plasma cleaning before the Au etch [30]. In that case, X-ray photoelectron spectroscopy suggested that some Au remained on the surface after cleaning [30].…”
supporting
confidence: 72%
“…Rough surfaces resembling nanoparticles scattered on the material have also been observed previously on monolayer features that had undergone energetic and extended O2 plasma cleaning before the Au etch [30]. In that case, X-ray photoelectron spectroscopy suggested that some Au remained on the surface after cleaning [30]. As an alternative to the solution of using a mild and short O2 plasma recipe, a thicker metal protection layer or a non-plasma-based recipe, such as atomic hydrogen cleaning [40], could be considered to remove polymer residue with minimal effect on the monolayer.…”
supporting
confidence: 71%
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