Chiroptically active, hierarchically structured materials
are difficult
to accurately characterize due to linear anisotropic contributions
(i.e., linear dichroism (LD) and linear birefringence (LB)) and parasitic
ellipticities that produce artifactual circular dichroism (CD) signals,
in addition to chiral analyte contributions ranging from molecular-scale
clusters to micron-sized assemblies. Recently, we have shown that
CdS magic-sized clusters (MSC) can self-assemble into ordered films
that have a hierarchical structure spanning seven orders of length-scale.
These films have a strong CD response, but the chiral origins are
obfuscated by the hierarchical architecture and LDLB contributions.
Here, we derive and demonstrate a method for extracting the “pure”
CD signal (CD generated by structural dissymmetry) from hierarchical
MSC films and identified the chiral origin. The theory behind the
method is derived using Mueller matrix and Stokes vector conventions
and verified experimentally before being applied to hierarchical MSC
and nanoparticle films with varying macroscopic orderings. Each film’s
extracted “true CD” shares a bisignate profile aligned
with the exciton peak, indicating the assemblies adopt a chiral arrangement
and form an exciton coupled system. Interestingly, the linearly aligned
MSC film possesses one of the highest g-factors (0.05)
among semiconducting nanostructures reported. Additionally, we find
that films with similar electronic transition dipole alignment can
possess greatly different g-factors, indicating chirality
change rather than anisotropy is the cause of the difference in the
CD signal. The difference in g-factor is controllable
via film evaporation geometry. This study provides a simple means
to measure “true” CD and presents an example of experimentally
understanding chiroptic interactions in hierarchical nanostructures.