Spatially resolved electrical characterisation of graphene layers by an evanescent field microwave microscope

Gregory, Andrew; Líu, Hao; Klein, N.; Gallop, John; Mattevi, Cecilia; Shaforost, Olena; Lees, K.; Clarke, Bob

doi:10.1016/j.physe.2012.10.006

Cited by 8 publications

(7 citation statements)

References 21 publications

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“…In principle if the position of the graphene sample was accurately known, a finite-element model could be used to calculate the linewidth shift arising from the presence of a graphene sample of known sheet resistance [8][9][10][11]. In reality this is very problematic, this is due to the difficulty of accurately meshing the finite-element model to give suitably high spatial resolution that the model deals accurately with layers of only 10 −10 m thickness and second, with structures of 20 mm in size or greater, accurate 3D modelling cannot be realistically achieved in a short time.…”

Section: Microwave Cavity Perturbation Methodsmentioning

confidence: 99%

Microwave method for high‐frequency properties of graphene

Líu

Gallop

Liu

et al. 2015

IET Circuits, Devices & Systems

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Graphene is a remarkable material which is yet to make the transition from unique laboratory phenomenon to useful industrial material. One missing element in the development process is a quick method of quality control of the electrical properties of graphene which may be applied in, or close to, the graphene growth process on an industrial scale. In this paper we describe a non-contact method using microwave resonance which potentially solves this problem. We describe the technique, consider its limitations and accuracy and suggest how the method may have future take up.

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Section: Microwave Cavity Perturbation Methodsmentioning

confidence: 99%

Microwave method for high‐frequency properties of graphene

Líu

Gallop

Liu

et al. 2015

IET Circuits, Devices & Systems

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“…When the conductivity of the specimen increases linearly, the reciprocal of 𝑄𝑄 could also increase concerning the conductivity. The Estore is the energy stored in the resonator, and 𝑄𝑄 is the quality factor that can be captured by the VNA and expressed in (3).…”

Section: A Theoretical Backgroundmentioning

confidence: 99%

“…That limits disable the optical microscope's resolution to explore the nano-range object. In 1928 and 1962, Synge and Soohoo demonstrated a method to utilize the microwave to interact with the complex permittivity, and the local conductivity of the specimen can also be deduced [1][2][3]. The technology of scanning microwave microscopy (SMM) has a breakthrough [4], and so has the NSMM system, which has already been explored with potential to the electronic industries [5][6].…”

Section: Introductionmentioning

confidence: 99%

Application of Near-Field Scanning Microwave Microscopy in Liquid Environment

et al. 2022

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In this article, a method of illustrating the electromagnetic properties of liquid specimens is proposed by our homemade near-field scanning microwave microscopy (NSMM). By introducing the fundamental theorem of NSMM and conducting a simulation on the configuration of the whole system, parameters including quality factor and resonant frequency in electrolyte liquid specimen vary with types of the solution as well as their concentration. By conducting the line scanning testing method, the relation of concentration of a specified solution concerning its corresponding electromagnetic properties is clarified. Eventually, yeast cells are tested at living or dead status with point scanning and line scanning separately. The NSMM experiment results exhibit a substantial capacity for biologic samples in a liquid environment.

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“…Near-field scanning microwave microscopy (NSMM) combines microwave characterisation with either STM [8] or AFM [9] using either a broadband [10] or resonant [11] probe. In the near-field mode the spatial resolution is limited by the size of the SPM tip which can be many orders of magnitude below the diffraction limit.…”

Section: Introductionmentioning

confidence: 99%

“…In the near-field mode the spatial resolution is limited by the size of the SPM tip which can be many orders of magnitude below the diffraction limit. Various implementations of NSMM has been used extensively in the classical regime to non-invasively obtain surface and subsurface information on semiconductor devices [12], defects in 2D materials [11], biological samples [13] and for investigating high-T c superconductivity [14], to name a few applications (for an overview see e.g. [15]).…”

Section: Introductionmentioning

confidence: 99%

Near-Field Scanning Microwave Microscopy in the Single Photon Regime

Geaney

Cox

Hönigl-Decrinis

et al. 2019

Sci Rep

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The microwave properties of nano-scale structures are important in a wide variety of applications in quantum technology. Here we describe a low-power cryogenic near-field scanning microwave microscope (NSMM) which maintains nano-scale dielectric contrast down to the single microwave photon regime, up to 10 9 times lower power than in typical NSMMs. We discuss the remaining challenges towards developing nano-scale NSMM for quantum coherent interaction with two-level systems as an enabling tool for the development of quantum technologies in the microwave regime.

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Spatially resolved electrical characterisation of graphene layers by an evanescent field microwave microscope

Cited by 8 publications

References 21 publications

Microwave method for high‐frequency properties of graphene

Microwave method for high‐frequency properties of graphene

Application of Near-Field Scanning Microwave Microscopy in Liquid Environment

Near-Field Scanning Microwave Microscopy in the Single Photon Regime

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