2011
DOI: 10.1016/j.nima.2010.12.147
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Spatially resolved X-ray spectroscopy using a flat HOPG crystal

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Cited by 8 publications
(3 citation statements)
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“…The 'satellite' emission region extends for several millimeters and corresponds to X-ray emission from an extended region of the target surface. Simulations were performed using the ray tracing code XOP/SHADOW [14] to confirm this (simulation parameters are detailed in reference [13]). To simplify the modeling, the spatial profile of the X-ray source was designed as two points, orientated in the spectral dispersion plane.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The 'satellite' emission region extends for several millimeters and corresponds to X-ray emission from an extended region of the target surface. Simulations were performed using the ray tracing code XOP/SHADOW [14] to confirm this (simulation parameters are detailed in reference [13]). To simplify the modeling, the spatial profile of the X-ray source was designed as two points, orientated in the spectral dispersion plane.…”
Section: Resultsmentioning
confidence: 99%
“…The two slits, both 30 µm in width, are parallel to each other and perpendicular to the crystal surface, thus providing one-dimensional (1D) spatial measurement via pinhole imaging and 1D spectral dispersion via Bragg diffraction. The design and characterization have been reported in detail elsewhere [13]. The spectrometer was positioned at 45 • to the target normal at the rear side and in the plane of the laser irradiation.…”
Section: The Experimentsmentioning
confidence: 99%
“…The experimental investigation of the measurement of electron temperature in the bulk plasma as a function of laser polarization inferred from the shifting of characteristic transition lines was achieved by employing one-dimensional imaged spectroscopy of Cu-Kα doublet via highly oriented pyrolytic graphite (HOPG) crystal spectrometer [29][30][31]. HOPG crystals consist of many small, perfectly aligned crystallites, making them highly efficient for x-ray diffraction over several keV ranges.…”
Section: Methodsmentioning
confidence: 99%