2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2024
DOI: 10.1109/dft63277.2024.10753551
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Special Session: Exploring the Potential of Versal ACAP: Advancing Onboard Edge AI for Spacecraft

Carlo Ciancarelli,
Davide di Ienno,
Renato Trois
et al.
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