Scanning Electron Microscopy and X-Ray Microanalysis 2003
DOI: 10.1007/978-1-4615-0215-9_10
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Special Topics in Electron Beam X-Ray Microanalysis

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Cited by 50 publications
(62 citation statements)
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“…The lightest element that can be detected by EDS is lithium [10][11][12]. The lithium K X-ray from LI to K shells is not an allowed transition [13] because it fails the azimuthal quantum number (l) selection rule, with both energy levels in the transition having the same value of orbital angular momentum (l=0). This means that likelihood of X-ray emission will be very low, unless bonding interaction causes the LI electron to take on more LII/III characteristics [14].…”
Section: Resultsmentioning
confidence: 99%
“…The lightest element that can be detected by EDS is lithium [10][11][12]. The lithium K X-ray from LI to K shells is not an allowed transition [13] because it fails the azimuthal quantum number (l) selection rule, with both energy levels in the transition having the same value of orbital angular momentum (l=0). This means that likelihood of X-ray emission will be very low, unless bonding interaction causes the LI electron to take on more LII/III characteristics [14].…”
Section: Resultsmentioning
confidence: 99%
“…However, the electron range for the energy of less than 100 eV is less than 1 nm [10,11] so that the above idea is not the case.…”
Section: Deepening Of Floating Potential For Tungsten Target Plate Onmentioning
confidence: 99%
“…Monte-Carlo modeling [22] was performed to estimate BSE energy distribution changes for different elements concentration. Negligible BSE energy distribution changes were obtained for investigated samples so BSE detector nonlinearity can be neglected [21]. It should be noted that interaction volume in investigated samples for electrons with energy of 10 keV is about 2 μm , BSE emission volume is about 800 nm, X-ray emission depth is about 1.5 μm and X-ray intensity radial distribution has a radius about 100 nm [22], what provides sufficient spatial resolution for EDX measurements in scan regime.…”
Section: Results Of Compositional and Structural Studiesmentioning
confidence: 86%
“…The observed BSE image of the waveguides cross-section originates from material contrast (not the surface relief) that is confirmed by comparison with images, obtained by secondary electrons (SE) registration. BSE yield of the glass was calculated as an average yield of all elements with expression suggested in [21]. Monte-Carlo modeling [22] was performed to estimate BSE energy distribution changes for different elements concentration.…”
Section: Results Of Compositional and Structural Studiesmentioning
confidence: 99%