2011
DOI: 10.1134/s1063774511030321
|View full text |Cite
|
Sign up to set email alerts
|

Specific features of sample preparation from amorphous aluminum alloys for transmission electron microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2014
2014
2020
2020

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(4 citation statements)
references
References 12 publications
0
4
0
Order By: Relevance
“…[5] In general, top down approaches such as Ion milling, slicing by using focused ion beam and electrochemical polishing methods are used to reduce the thickness of the sample to prepare electron beam transparent samples. [2,[6][7][8] On the other hand, bottom up approaches that using direct deposition of thin layers on TEM-Window [9] and also on lacey/holy carbon grids were reported scarcely. Several non-conventional methods were adopted for different materials to be prepared as in-situ TEM specimens.…”
Section: Background Of the Workmentioning
confidence: 99%
See 1 more Smart Citation
“…[5] In general, top down approaches such as Ion milling, slicing by using focused ion beam and electrochemical polishing methods are used to reduce the thickness of the sample to prepare electron beam transparent samples. [2,[6][7][8] On the other hand, bottom up approaches that using direct deposition of thin layers on TEM-Window [9] and also on lacey/holy carbon grids were reported scarcely. Several non-conventional methods were adopted for different materials to be prepared as in-situ TEM specimens.…”
Section: Background Of the Workmentioning
confidence: 99%
“…Electropolishing method has been proposed for TEM sample preparation of metallic samples, especially for the study of amorphous structures by TEM. [8,14] However, the preferential milling involved in the electro polishing technique has been reported as detrimental for obtaining electron transparent sample. [15] Focused ion beam (FIB) is used with several pre-and post-steps to slice an ultrathin electron beam transparent sample from bulk material to be placed on TEM-Window.…”
Section: Background Of the Workmentioning
confidence: 99%
“…can lead to significant structural changes. Al85Ni7Fe4La4 alloy amorphous ribbons are treated according to the following scheme: 1) annealing was conducted in the temperature range from 150 to 400ºC with the 50 ºC interval and 15 and 30 min exposure at each temperature with further cooling at the air; 2) severe plastic deformation was conducted at the ambient temperature in the Bridgman chamber at 8 GPa of hydrostatical pressure and at the rotation angle of movable anvil φ=360°×n (where n=1, 3, 6); 3) irradiation with carbon 12 …”
Section: Materials and Techniquesmentioning
confidence: 99%
“…Utilization of reduced accelerating voltage at samples preparation allows to avoid their substantial heating which may result in structural and constitutional change in alloys not associated with the processes under consideration. Research on ionic thinning (by Ar + ions) influence in wide range of parameters on phase transformation in amorphous alloys [12] was conducted earlier by the authors to determine optimum polishing regime.…”
Section: +3mentioning
confidence: 99%