Specific features of the formation of diffraction patterns of metallofullerene crystals

Effect of the γ→ε Phase Transition on Transformation-Induced Plasticity (TRIP) of Nickel-Free High Nitrogen Steel at Low Temperatures

“…λ Cu = 1.54 Å is the X-ray beam wavelength; θ 1 and θ 2 are diffraction angles; |F 1 | 2 and |F 2 | 2 are the structural factors of intensity of the (111) γ and (222) γ austenite reflections, respectively; |F i | 2 = 16 f (θ i ) [21]; f (θ i ) is the material scattering factor, calculated from the sin(θ i )/λ value for each of the (111) γ and (222) γ austenite reflexes; P 1 /P 2 = 1 is the ratio of the repeatability factors for the {111} planes in the fcc lattice.…”

“…It was shown in [20][21][22] that the magnitude of the displacement, namely the 2 U square root of the total RMS displacement, is proportional to the number of atoms per Bravais cell. There are four atoms per Bravais cell in the fcc lattice.…”