Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features

Hartshorne, Matthew; Isheim, Dieter; Seidman, David N.; Taheri, Mitra L.

doi:10.1016/j.ultramic.2014.05.005

Cited by 18 publications

(7 citation statements)

References 64 publications

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“…When the final tip shape was approached (radius of curvature ~100 nm), the milling parameters were reduced to 5 keV 25 pA to reduce Ga + implantation and surface damage. Further details of the sample preparation method can be found in refs 50 and 51 .…”

Section: Methodsmentioning

confidence: 99%

Grain Boundary Specific Segregation in Nanocrystalline Fe(Cr)

Zhou

Kaub

et al. 2016

Sci Rep

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A cross-correlative precession electron diffraction – atom probe tomography investigation of Cr segregation in a Fe(Cr) nanocrystalline alloy was undertaken. Solute segregation was found to be dependent on grain boundary type. The results of which were compared to a hybrid Molecular Dynamics and Monte Carlo simulation that predicted the segregation for special character, low angle, and high angle grain boundaries, as well as the angle of inclination of the grain boundary. It was found that the highest segregation concentration was for the high angle grain boundaries and is explained in terms of clustering driven by the onset of phase separation. For special character boundaries, the highest Gibbsain interfacial excess was predicted at the incoherent ∑3 followed by ∑9 and ∑11 boundaries with negligible segregation to the twin and ∑5 boundaries. In addition, the low angle grain boundaries predicted negligible segregation. All of these trends matched well with the experiment. This solute-boundary segregation dependency for the special character grain boundaries is explained in terms of excess volume and the energetic distribution of the solute in the boundary.

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Section: Methodsmentioning

confidence: 99%

Grain Boundary Specific Segregation in Nanocrystalline Fe(Cr)

Zhou

Kaub

et al. 2016

Sci Rep

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“…[33,34] Samples for both atom-probe tomography (APT) and scanning transmission electron microscopy (STEM) characterization were prepared by the lift-out method, utilizing a dual-beam FIB microscope (Helios Nanolab, FEI Co., Hillsboro, OR, USA).…”

Section: Sample Preparation For Apt and Stemmentioning

confidence: 99%

Atomic‐Scale Structural and Chemical Study of Columnar and Multilayer Re–Ni Electrodeposited Thermal Barrier Coating

et al. 2016

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Rhenium alloys exhibit a unique combination of chemical, physical, and mechanical properties that makes them attractive for a variety of applications. Herein, we present atomic-scale structural and atomic part-per-million level three-dimensional (3D) chemical characterization of a Re-Ni coating, combining aberration-corrected scanning transmission electron microscopy (STEM) and atom-probe tomography (APT). A unique combination of a columnar and multilayer structure is formed by singlebath dc-electroplating and is reported here for the first time. Alternating thicker Re-rich and thinner Ni-rich layers support a mechanism in which Ni acts as a reducing agent. The multilayers exhibit hetero-epitaxial growth resulting in high residual shear stresses that lead to formation of corrugated interfaces and an outer layer with mud-cracks. IntroductionRhenium (Re) is a refractory metal with a unique combination of chemical, physical, and mechanical properties that makes it attractive for high-temperature, catalytic, energy, electrical, biomedical, and other applications, in spite of its high cost. [1,2] Interest in electroless deposition [3,4] and electrodeposition [5][6][7][8][9][10][11][12][13][14][15][16] of Re and its alloys has recently emerged. Electroplating of pure Re yields poor deposition results. The addition of salts of the iron-group metals (Ni, Fe, and Co) to the plating bath improves, however, the coating dramatically, allowing deposition of thick layers of the

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“…With the development of the FIB, an abundance of new applications became accessible to APT [17,18]. A number of other publications describe techniques using the dual-beam FIB for the re-sharpening of blunt electropolished needles, for in situ lift-out from the bulk as well as for the construction of atom probe needles from thin sheets, ribbons or powder particles [13,[18][19][20][21][22][23][24][25][26][27][28].…”

Section: Introductionmentioning

confidence: 99%