Speckle intensity correlation in the diffraction region near rough surfaces and simulational experiments for extraction of surface parameters

Abstract

Based on the light scattering theory of Kirchoff approximation, the correlation function of the speckle intensities relating to that of the random surfaces is quantitatively formulated in correspondence with the principles of Van Cittert-Zernike theorem. We then propose the method for the extraction of surfaces parameters from the correlation functions of speckles intensity produced by light scattering in the region near the random surfaces. The experiments of light scattering in the region near random self-affine fractal surfaces are simulated, and the 3 parameters, i.e., the roughness w, the lateral correlation length ξ and the roughness exponent α, are extracted by fitting the correlation function data of the speckle intensities to the formulated expression. The extracted values of the surface parameters conform well with the set values.

Detection of Cancer in Animal Tissues: A Wavelet Approach

“…This measurement technique is identified as an alternative to that of a conventional mechanical stylus (DAINTY et al, 1975. ) Several speckle pattern analysis methods have been investigated in literature to facilitate different application tasks including the speckle contrast (GEORGE, 1975), autocorrelation function (CHENG, 2004), etc. In addition to speckle pattern analysis, the temporal variations of speckle patterns are found to depend strongly on the activity level of the sample surface illuminated.…”