The obtained results suggest that 60Co γ-irradiation with small doses (Dγ~140 Gy) has a complex impact on close AuNi/n-n+-GaN{0001} Schottky contacts. Such impact manifests itself in disappearance of current steps in the initial section of the forward current-voltage curve; improvement of average values of ideality factor n and decrease of average values of true Schottky barrier height φbn in the middle section; and increase of series resistance Rs and enhancement of the inhomogeneous metal–semiconductor contact series resistance effect in the final section. In all cases the observed changes have a sustainable nature. The combination of the Zur–McGill–Smith close Schottky contact defect model, the inhomogeneous contact model and the radiation-induced defects formation model provides an explanation for physical mechanisms of the changes observed in electrophysical and device characteristics after γ-irradiation. Such mechanisms are associated with changes in electrophysical nature of GaN structural defects (dislocations and interface states) and degradation of contact conductivity homogeneity. The paper shows that the low temperature anomaly also manifests itself in close AuNi/n-n+-GaN Schottky contacts subjected to γ-irradiation.