Spectral Analysis for Resonant Soft X-Ray Scattering Enables Measurement of Interfacial Width in 3D Organic Nanostructures

Abstract

Interfaces are of critical importance to many materials and phenomena yet are difficult to probe. This difficulty is compounded in three-dimensional nanostructures and with delicate organic materials. Here we demonstrate a quantitative spectral analysis of resonant soft x-ray scattering that can accurately measure properties of buried nonplanar interfaces within polymeric systems. We measure the scattering invariant on an absolute scale to quantify the interfacial volume and width involved in mixing at the interface of block copolymer nanostructures. Using continuous contrast tuning, this spectral analysis enables the separation and identification of any number of unique scatterers in complex nanostructures.

Resonant soft X-ray scattering reveals cellulose microfibril spacing in plant primary cell walls

“…We consider the scattering between pectin and vacuum from the top surface, pectin and cellulose within the cell wall, and pectin and cuticle at the pectin/cuticle interface. The TSI from each layer is related to scattering contrast as 70 , 71 where i and j represent the two components in each onion epidermis layer ( e.g ., cellulose and pectin, Fig. S1 of the Supplementary Information), V is the total scattering volume of the layer, and is the product of the volume fraction between domains i and j .…”

Mixed Domains Enhance Charge Generation and Extraction in Bulk‐Heterojunction Solar Cells with Small‐Molecule Donors

“…To correct for this, we measure , by tilting the film within the X-ray beam and correcting for the lower symmetry as was described in our previous publication. [86] The data used for this calculation is displayed in Figure S13c & d showing cylindrical symmetry for the scattering pattern. SM2 blends, having domain sizes well below the film thickness were assumed to scatter in a spherically symmetric pattern.…”

Resonant soft X‐ray scattering in polymer science

“…To accurately measure three‐dimensional structure within a thin film quantitatively it is suggested to measure scattering of the sample when tilted away from normal incidence (sometimes up to 70 degrees from normal can be achieved) 58 . This allows measurement of the out‐of‐plane morphology and has been used effectively to allow quantitative analyses.…”

“…Thus it is important to confirm that the bulk of the scattering signal comes from an that is significantly smaller than the film thickness. RSoXS measurements with the film tilted as described above can be analyzed correct for this issue 58 . A third assumption that is there are only two phases in the system.…”