Spectral interference refractometry by diode array spectrometry

Gauglitz, Güenter; Krause-Bonte, J.; Schlemmer, Harry; Matthes, Axel

doi:10.1021/ac00174a015

Cited by 35 publications

(17 citation statements)

References 13 publications

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“…This software calculates the thickness of the polymer layer for each sensor element, within each measurement cycle, using the interference fringe by evaluation of prominent data points of the interference spectrum [13]. The analyte/gas [20] mixture was generated according to [14]. The calibration experiments were performed in synthetic air (20.5 % O 2 in N 2 ).…”

Section: Reflectometric Interference Spectroscopymentioning

confidence: 99%

Suitability of hyperbranched polyester for sensoric applications - investigation with reflectometric interference spectroscopy

Belge

Beyerlein

Betsch

et al. 2002

Analytical and Bioanalytical Chemistry

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Hyperbranched polyesters (HBP) with different end groups (P-OH, P-COOH, P-OAc) were prepared as thin films. Their surface properties were investigated using zeta potential and contact angle measurements. The differences in surface properties between P-OH and P-COOH, on the one hand, and P-OAc, on the other hand, predicted different behavior in sensoric applications. Therefore, the vapor of the homologous series of alcohols from methanol to pentanol was exposed to the thin films. Changes in thickness were observed with reflectometric interference spectroscopy (RIfS). First investigations in a current analytical problem for the detection and discrimination of refrigerants (freons) using P-OH as sensitive layer have been shown. Polydimethylsiloxane (PDMS) and poly(ether urethane) (PUT) were used as reference sensor materials for the RIfS measurements.

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Section: Reflectometric Interference Spectroscopymentioning

confidence: 99%

Suitability of hyperbranched polyester for sensoric applications - investigation with reflectometric interference spectroscopy

Belge

Beyerlein

Betsch

et al. 2002

Analytical and Bioanalytical Chemistry

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“…1 pm to be observed. The method is dynamic and has response times of < 1 s if diode arrays are used to obtain interference spectra [189]. The method is called reflectometric interference spectroscopy (RIfS) [187].…”

Section: Determination Of Film Thicknessmentioning

confidence: 99%

Ultraviolet and Visible Spectroscopy

Gauglitz

2008

Ullmann's Encyclopedia of Industrial Chemistry

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The article contains sections titled: 1. Introduction 1.1. Comparison with Other Spectroscopic Methods 1.2. Development and Uses 2. Theoretical Principles 2.1. Electronic States and Orbitals 2.2. Interaction Between Radiation and Matter 2.2.1. Dispersion 2.2.2. Absorption 2.2.3. Scattering 2.2.4. Reflection 2.2.5. Band Intensity 2.3. The Lambert–BeerLaw 2.3.1. Definitions 2.3.2. Deviations from the Lambert ‐ Beer Law 2.4. Photophysics 2.4.1. Energy Level Diagram 2.4.2. Deactivation Processes 2.4.3. Transition Probability and Fine Structure of the Bands 2.5. Chromophores 2.6. Optical Rotatory Dispersion and Circular Dichroism 2.6.1. Generation of Polarized Radiation 2.6.2. Interaction with Polarized Radiation 2.6.3. Optical Rotatory Dispersion 2.6.4. Circular Dichroism and the Cotton Effect 2.6.5. Magnetooptical Effects 3. Optical Components and Spectrometers 3.1. Principles of Spectrometer Construction 3.1.1. Sequential Measurement of Absorption 3.1.2. Multiplex Methods in Absorption Spectroscopy 3.2. Light Sources 3.2.1. Line Sources 3.2.2. Sources of Continuous Radiation 3.2.3. Lasers 3.3. Selection of Wavelengths 3.3.1. Prism Monochromators 3.3.2. Grating Monochromators 3.3.3. Electro‐Acoustic and Opto‐Acoustic Wavelength Generation 3.4. Polarizers and Analyzers 3.5. Sample Compartments and Cells 3.5.1. Closed Compartments 3.5.2. Modular Arrangements 3.5.3. Open Compartments 3.6. Detectors 3.7. Optical Paths for Special Measuring Requirements 3.7.1. Fluorescence Measurement 3.7.2. Measuring Equipment for Polarimetry, ORD, and CD 3.7.3. Reflection Measurement 3.7.4. Ellipsometry 3.8. Effect of Equipment Parameters 3.9. Connection to Electronic Systems and Computers 4. Uses of UV ‐ VIS Spectroscopy in Absorption, Fluorescence, and Reflection 4.1. Identification of Substances and Determination of Structures 4.2. Quantitative Analysis 4.2.1. Determination of Concentration by Calibration Curves 4.2.2. Classical Multicomponent Analysis 4.2.3. Multivariate Data Analysis 4.2.4. Use in Chromatography 4.3. Fluorimetry 4.3.1. Inner Filter Effects 4.3.2. Fluorescene and Scattering 4.3.3. Excitation Spectra 4.3.4. Applications 4.4. Reflectometry 4.4.1. Diffuse Reflection 4.4.2. Color Measurement 4.4.3. Regular Reflection 4.4.4. Determination of Film Thickness 4.4.5. Ellipsometry 4.5. Resonance Methods 4.5.1. SurfacePlasmon Resonance 4.5.2. Grating Couplers 4.5.3. Other Evanescent Methods 4.5.4. Interferometric Methods 4.6. On‐Line Process Control 4.6.1. Process Analysis 4.6.2. Measurement of Film Thicknesses 4.6.3. Optical Sensors 4.7. Measuring Methods Based on Deviations from the Lambert – Beer Law 5. Special Methods 5.1. Derivative Spectroscopy 5.2. Dual‐Wavelength Spectroscopy 5.3. Scattering 5.3.1. Turbidimetry 5.3.2. Nephelometry 5.3.3. Photon Correlation Spectroscopy 5.4. Luminescence, Excitation, and Depolarization Spectroscopy, and Measurement of Lifetimes 5.5. Polarimetry 5.5.1. Sugar Analysis 5.5.2. Cellulose Determination 5.5.3. Stereochemical StructuralAnalysis 5.5.4. Use of Optical Activity Induced by a Magnetic Field 5.6. Photoacoustic Spectroscopy (PAS)

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“…Reflectometric interference spectroscopy (RIfS) is a timeresolved optical technique which is based on the (spectral) shift of the interference pattern reflected from a transparent thin film [1][2][3][4]. The wavelength shift is caused by the immobilization of molecules during different antigen-antibody reactions (in aqueous phase) [5][6][7], or by the adsorption of volatile compounds (in gas phase) [8].…”

Section: Introductionmentioning

confidence: 99%