Spectral RTL Test Generation for Gate-Level Stuck-at Faults

Yogi,; Agrawal, Govind P.

doi:10.1109/ats.2006.260997

Cited by 14 publications

(7 citation statements)

References 23 publications

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“…ATPG vectors are analyzed for spectrum and random noise level. The ATPG vectors can be derived from gate, register-transfer, or function level algorithms [18,19] for fault models like stuck-at, delay [20], or several combined fault models [21]. Our hardware patterns mimic the characteristics of ATPG vectors by controlled mixing of spectral components and noise.…”

Section: Resultsmentioning

confidence: 99%

“…Spectral analysis is performed using Hadamard transform [19] to obtain the components of Walsh spectrum in each bit-stream. The ATPG vectors are analyzed in sets, each of length N , where N is the dimension chosen for the Hadamard matrix.…”

Section: Spectral Analysismentioning

confidence: 99%

“…Any bit-stream of k bits can be represented as a linear combination of Walsh functions contained in the Hadamard matrix, H(log 2 k). Hence, by spectral analysis of bit-streams supplied to primary inputs by test vectors the principal contributing Walsh functions can be determined, as described in the literature [7,19].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Sequential Circuit BIST Synthesis Using Spectrum and Noise from ATPG Patterns

Yogi

Agrawal

2008

2008 17th Asian Test Symposium

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ATPG patterns of a digital sequential circuit contain temporally and spatially ordered bits as well as random (or don't care) bits. We synthesize BIST hardware that mimics these characteristics by controlled mixing of spectral components and noise. A Hadamard digital wave generator circuit produces all required spectral sequences and a weighted pseudorandom bit generator provides random bits. While these two blocks serve the entire circuit under test, specific to each primary input are two small blocks, one that combines the required Hadamard sequences in proper proportions and the other a randomizer that adds the required amount of noise if necessary. As an example, the FlexTest ATPG produced 55110 patterns for s38417, detecting 15472 of 31180 stuck-at faults. Sixty four-thousand of our BIST patterns detected 17020 faults as compared to 4244 detected by a previously reported spectral BIST method utilizing similar hardware overhead.

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Section: Resultsmentioning

confidence: 99%

Section: Spectral Analysismentioning

confidence: 99%

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Sequential Circuit BIST Synthesis Using Spectrum and Noise from ATPG Patterns

Yogi

Agrawal

2008

2008 17th Asian Test Symposium

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“…An RTL fault grading approach was used to ameliorate the gate-level fault coverage by Mao et al [9]. RTL-level tests were generated and reused for detecting gate-level stuck-at-faults by Yogi et al [10]. Recently RSS algorithms were proposed by Ko et al [11].…”

Section: Related Workmentioning

confidence: 99%

RATS: Restoration-Aware Trace Signal Selection for Post-Silicon Validation

Basu

Mishra

2013

IEEE Trans. VLSI Syst.

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Post-silicon validation is one of the most important and expensive tasks in modern integrated circuit design methodology. The primary problem governing post-silicon validation is the limited observability due to storage of a small number of signals in a trace buffer. The signals to be traced should be carefully selected in order to maximize restoration of the remaining signals. Existing approaches have two major drawbacks. They depend on partial restorability computations that are not effective in restoring maximum signal states. They also require long signal selection time due to inefficient computation as well as operating on gate-level netlist. We have proposed a signal selection approach based on total restorability at gate-level, which is computationally more efficient (10 times faster) and can restore up to three times more signals compared to existing methods. We have also developed a register transfer level signal selection approach, which reduces both memory requirements and signal selection time by several orders-of-magnitude.

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“…Zhang et al [36] refined the method of extracting the spectra from a digital signal using a selfish gene algorithm. Yogi and Agrawal introduced a spectral RTL test generation method for stuck-at faults for sequential circuits [34] and for microprocessors [35]. The contribution of this paper is a method for deriving transition fault tests [19] used in delay testing of processor circuits.…”

Section: Introductionmentioning

confidence: 99%

Transition Delay Fault Testing of Microprocessors by Spectral Method

Yogi

Agrawal

2007

2007 Thirty-Ninth Southeastern Symposium on System Theory

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We introduce a novel spectral method of delay test generation for microprocessors at the register-transfer level (RTL). Vectors are first generated by an available ATPG tool for transition faults on inputs and outputs of the RTL modules of the circuit. These vectors are analyzed using Hadamard matrices to obtain Walsh function components and random noise levels for each primary input. A large number of vector sequences is then generated such that all sequences have the same Walsh spectrum but they differ due to the random noise in them. At the gate-level, a fault simulator and an integer linear program (ILP) compact these vector sequences. The initial RTL vector generation also reveals the hard-to-test parts of the circuit. An XOR observability tree was used to improve the testability of those parts. We give results for an accumulator-based processor named Parwan. The RTL technique produced higher gate-level transition fault coverage in shorter CPU time as compared to a gate-level transition fault ATPG.

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Spectral RTL Test Generation for Gate-Level Stuck-at Faults

Cited by 14 publications

References 23 publications

Sequential Circuit BIST Synthesis Using Spectrum and Noise from ATPG Patterns

Sequential Circuit BIST Synthesis Using Spectrum and Noise from ATPG Patterns

RATS: Restoration-Aware Trace Signal Selection for Post-Silicon Validation

Transition Delay Fault Testing of Microprocessors by Spectral Method

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