2004
DOI: 10.1016/j.tsf.2003.11.251
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Spectroellipsometric study of the sol–gel nanocrystalline ITO multilayer films

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Cited by 26 publications
(12 citation statements)
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“…[4] Wet deposition techniques are of emerging interest due to their high cost reduction potential based on missing vacuum demand, printing possibility comprising large area fabrication potential, and the feasibility of direct patterning. Beside the several deposition methods, there exist two different principles of wet chemical processing: The sol-gel-technique, characterized by deposition of precursors with subsequent transformation into ITO [25][26][27][28][29][30] and the deposition of a dispersion containing ITO nanoparticles. [30][31][32][33][34] Sol-gel ITO films can possess adequate conductances of >350 V À1 cm À1 , [25,26,35] which can be increased to >1600 V À1 cm À1 by temperature treatment in nitrogen or forming gas.…”
mentioning
confidence: 99%
“…[4] Wet deposition techniques are of emerging interest due to their high cost reduction potential based on missing vacuum demand, printing possibility comprising large area fabrication potential, and the feasibility of direct patterning. Beside the several deposition methods, there exist two different principles of wet chemical processing: The sol-gel-technique, characterized by deposition of precursors with subsequent transformation into ITO [25][26][27][28][29][30] and the deposition of a dispersion containing ITO nanoparticles. [30][31][32][33][34] Sol-gel ITO films can possess adequate conductances of >350 V À1 cm À1 , [25,26,35] which can be increased to >1600 V À1 cm À1 by temperature treatment in nitrogen or forming gas.…”
mentioning
confidence: 99%
“…Only a few template-assisted sol-gel syntheses using ITO have been reported, providing powders with quite high resistivity [6] or materials with irregular porosity resulting from the loose packing of crystallites. [7,8] Hence, subsequent functionalization of such material is significantly impeded. Mesoporous powders and macroporous films of undoped indium oxide were produced by sol-gel processes, but the resistivity of such material is usually too high for practical applications.…”
mentioning
confidence: 99%
“…Characteristic optical properties of thin film structures can be derived from spectroscopic SE measurement, which is known to be a high-precision optical characterization technique. [34][35][36][37][38] Variable Angle Spectroscopic Ellipsometry (VASE) allows measurements at multiple angles of incidence. A new angle will change the length of the light penetrating through the materials.…”
Section: Introductionmentioning
confidence: 99%
“…Among the several reports on the optical constants of ITO thin films evaluated by spectroscopic ellipsometry, [2][3][4]10,11,14,16,25,35 the recent work by Jung 14 is most comprehensive. Jung investigated ITO thin films prepared under various DC magnetron sputtering conditions 14 using VASE.…”
Section: Introductionmentioning
confidence: 99%