The size and refractive index of particles can be analyzed through the measurement of polarization state of scattered light. The change of polarization state in Mie scattering has been represented by ellipsometric parameters, Ψ and Δ, like the reflection ellipsometry. The analysis method is called Mie-scattering ellipsometry. By in-process Miescattering ellipsometry, the growth processes of carbon particles in argon plasma and in methane plasma were analyzed. It was found that carbon particles grow by coagulation in argon plasma, while they grow by carbon coating in methane plasma. It is also shown that imaging Mie-scattering ellipsometry has the potential for the easier confirmation of optical adjustment from a long distance, as well as for the analysis of spatial distribution of particle size.