2003
DOI: 10.1016/s0304-3991(03)00106-2
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Spectroscopic electron tomography

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Cited by 176 publications
(131 citation statements)
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“…33 In this study, the Pt atomic columns were clearly observed and the Fe Kagomé layer (3/4 monolayer) and the 1/4 monolayer were also 34 Recently, a resolution of 2.4 Å was obtained for Au single crystalline NP 35 and Pt nanodecahedra 36 with twin boundaries. Some advanced algorithms, such as the Compressive Sensing algorithm, were utilized to achieve better resolution for Au nanorods (NRs).…”
Section: Synthetic Methodologies Of Nhssmentioning
confidence: 51%
“…33 In this study, the Pt atomic columns were clearly observed and the Fe Kagomé layer (3/4 monolayer) and the 1/4 monolayer were also 34 Recently, a resolution of 2.4 Å was obtained for Au single crystalline NP 35 and Pt nanodecahedra 36 with twin boundaries. Some advanced algorithms, such as the Compressive Sensing algorithm, were utilized to achieve better resolution for Au nanorods (NRs).…”
Section: Synthetic Methodologies Of Nhssmentioning
confidence: 51%
“…With the advent of high angle annular dark field (HAADF) STEM tomography for the three dimensional imaging of crystalline materials 1 , energy dispersive X-ray tomography was also proposed as a method to allow the determination of elemental distributions in three dimensions 2 . However, early studies were limited due to the design of X-ray detectors within the transmission electron microscope.…”
Section: Introductionmentioning
confidence: 99%
“…The acquisition time for a tomographic data set may be reduced and/or enables the use of more sophisticated imaging and spectroscopy techniques, which generally need a longer acquisition per pixel, but lead to remarkably rich data sets. One area that will grow rapidly is the 3D mapping of composition, especially via STEM-EDX spectrumimaging, building on early work [4]. Although EELS-and EFTEM-based tomography are possible [4][5][6], the introduction of larger, more efficient, x-ray detectors (with ca.…”
mentioning
confidence: 99%
“…One area that will grow rapidly is the 3D mapping of composition, especially via STEM-EDX spectrumimaging, building on early work [4]. Although EELS-and EFTEM-based tomography are possible [4][5][6], the introduction of larger, more efficient, x-ray detectors (with ca. 1sr solid angle) offers the possibility of routine 3D mapping of nanoscale materials.…”
mentioning
confidence: 99%