Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions

Abstract

In this work, spectroscopic ellipsometry and vector network analysis are used to determine the electromagnetic response of three samples, an epoxy polymer, a sample with ferrit‐based nanoparticles in a polymer matrix and silicon, in the wavelength ranges 0.4‐30 μm and 0.75‐7.59 cm. Both methods measure amplitude and phase changes due to interaction with a sample and can be used to measure the full complex‐valued dielectric response to electromagnetic radiation. The data from the two methods show similar levels of the response at the two ends of the spectral gap between the ranges of the two methods. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Optical Studies of Materials for Spectral Design

“…A thorough explanation of the need of materials for camouflage application and military utility of spectral design is found in Paper I [5]. Broadband studies of the optical properties of different materials are found in Paper II [6]. Studies of dynamic properties of a dye are presented in Paper III [7] and of a polymer in Paper IV [8].…”

A review of materials for spectral design coatings in signature management applications

“…A signature management coating for optical wavelengths must therefore not interfere with the targets spectral design for radar wavelengths. 13 In most applications this means the reflectance of the coating should be very low. This can be achieved by making the coating very thin and transmissive, deposited on top of a radar absorbing coating, or by using a material with high absorption.…”