2017
DOI: 10.1016/j.triboint.2016.12.021
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Spectroscopic ellipsometry and X-ray photoelectron comparative studies of tribofilms formed on cast iron surfaces

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Cited by 4 publications
(2 citation statements)
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“…It has been used to measure the thickness of surfactant monolayers on gold , and silicon , surfaces and adsorption kinetics and surface layer thicknesses in situ of many systems, such as proteins , and polymers, in aqueous systems. Ellipsometry has also been applied to quantify the thickness of a ZDDP tribofilm, as well as the thickness of DLC coatings and MoS 2 layers in air . Within a sliding contact lubricated with a base oil, ellipsometry has been used to measure in situ the oil film thickness between the two surfaces with nm accuracy .…”
Section: Experimental Methodsmentioning
confidence: 99%
“…It has been used to measure the thickness of surfactant monolayers on gold , and silicon , surfaces and adsorption kinetics and surface layer thicknesses in situ of many systems, such as proteins , and polymers, in aqueous systems. Ellipsometry has also been applied to quantify the thickness of a ZDDP tribofilm, as well as the thickness of DLC coatings and MoS 2 layers in air . Within a sliding contact lubricated with a base oil, ellipsometry has been used to measure in situ the oil film thickness between the two surfaces with nm accuracy .…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The wear of different materials can be measured parallel and continuously by using different isotopes [15]. Previous studies have shown that such a tracer method is suitable for wear studies on different materials or under various loading conditions [16], [20], [21]. Berlet et al [22] and Faller et al [23] used radio nuclide tracers for DLC wear studies and found loading condition dependent wear rates.…”
Section: Introductionmentioning
confidence: 99%