2001
DOI: 10.1021/jp002592d
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Spectroscopic Ellipsometry Investigation of the Swelling of Poly(Dimethylsiloxane) Thin Films with High Pressure Carbon Dioxide

Abstract: The thickness and refractive index of poly(dimethylsiloxane) (PDMS) thin films on silicon, exposed to high-pressure carbon dioxide, have been measured in-situ by spectroscopic ellipsometry. The swelling of the film is determined from the thickness and the sorption of CO2 from the refractive index. The sorption and swelling values for the thin films exceed those of the bulk films. These increases may be attributed to excess CO2 at the polymer thin film−CO2 and polymer−silica interfaces and the influence of the … Show more

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Cited by 91 publications
(172 citation statements)
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“…Thus, properties such as surface area and pore diameters of porous polymers can be manipulated through CO 2 pressure changes. Johnston and co-workers 32 have also used CO 2 to swell thin films of poly(dimethylsiloxane) on silicon substrates. Film swelling was measured using in situ high pressure elliposmetry techniques.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, properties such as surface area and pore diameters of porous polymers can be manipulated through CO 2 pressure changes. Johnston and co-workers 32 have also used CO 2 to swell thin films of poly(dimethylsiloxane) on silicon substrates. Film swelling was measured using in situ high pressure elliposmetry techniques.…”
Section: Introductionmentioning
confidence: 99%
“…Aboudheir et al [33] determined the absorption rate for partial loaded MEA solutions for three different degrees of CO 2 loading (0.0996, 0.3015, 0.4725 mol/mol) and also observed a strong decrease with increasing CO 2 loading degree.…”
Section: Effect Of Partial Co 2 Loadingmentioning
confidence: 99%
“…The densities of the gas and the polymer and the refractive index of pure CO 2 can be obtained from literature [33], whereas the refractive index of the pure polymer can be experimentally determined from an ellipsometry experiment at zero pressure (vacuum).…”
Section: Ellipsometrymentioning
confidence: 99%
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