2006
DOI: 10.1002/pssa.200669656
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Spectroscopic phase modulated ellipsometry in application to some novel single and polycrystalline ternary compounds

Abstract: The results of the application of the spectroscopic phase modulated ellipsometry (SPME) to a series of novel ternary compounds from anisotropic to polycrystalline are presented to show the high effectiveness of this optical technique with regard to the dielectric function of the new materials. Besides, SPME in specular reflection mode to study the polarization degree of the light reflected at specular angle is shown to be very informative in determination of the best conditions for optical measurements on roug… Show more

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Cited by 12 publications
(6 citation statements)
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“…We have managed to reliably track down the temperature evolution of the dielectric function of TlInS 2 in E ║ c * polarization with the aid of spectroscopic phase modulated ellipsometry we used to apply to TlMeX 2 .…”
Section: Introductionmentioning
confidence: 99%
“…We have managed to reliably track down the temperature evolution of the dielectric function of TlInS 2 in E ║ c * polarization with the aid of spectroscopic phase modulated ellipsometry we used to apply to TlMeX 2 .…”
Section: Introductionmentioning
confidence: 99%
“…Это связано с кластеризацией в образцах и недостающая часть нанокристаллитов скапливается в кластерах, что будет показано далее. В работе [6] описана методика исследования корреляции между деполяризацией D и зернистостью и определения среднего размера зерен. Применительно к нашему случаю, эти исследования помогли оценить средние размеры микрокластеров, образованных группами наночастиц.…”
Section: эллипсометрические измерения и анализ полученных данныхunclassified
“…While room temperature dielectric function and optical constants of TlInSe 2 have been studied in detail by SE in a number of works (see, for example, [13]), temperature-dependent SE has not been performed ever before on this material.…”
Section: Introductionmentioning
confidence: 99%