1982
DOI: 10.1070/pu1982v025n03abeh004519
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Spectrum and polarization of hot-electron photoluminescence in semiconductors

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Cited by 155 publications
(56 citation statements)
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“…Therefore, the valleys do not determine the anisotropy. On the other hand, an isotropic r R in the 111 plane is consistent with the symmetry of the heavy hole band [90].…”
Section: Polarization Properties Of the Photoluminescence Under Resonmentioning
confidence: 57%
See 1 more Smart Citation
“…Therefore, the valleys do not determine the anisotropy. On the other hand, an isotropic r R in the 111 plane is consistent with the symmetry of the heavy hole band [90].…”
Section: Polarization Properties Of the Photoluminescence Under Resonmentioning
confidence: 57%
“…The influence of the electronic transitions on the absorption and the emission processes is neglected. This is a good approximation if the excited carriers are able to relax before recombination, but in the absence of relaxation the electronic states and their symmetry are important in determining the polarization [60,90,91]. Below we examine the polarization in porous silicon in the resonant excitation regime.…”
Section: Polarization Properties Of the Photoluminescence Under Resonmentioning
confidence: 97%
“…The anisotropy parameter A equals +1 for the transition from the light-hole valence band while \ = -1 for the transition from the heavy-hole band. 7 Because of the larger density of states of the heavy-hole band, the latter transition is the more intense. For it, the right-hand side of Eq.…”
mentioning
confidence: 99%
“…The position of this peak is also bias independent, and we attribute this feature to recombination of electrons in the emitter region of the structure with holes in the spin-orbit split off valence band (e-h so recombination). Such recombination has previously been observed in PL spectroscopy by Zakharchenya et al [7]. In the present experiment, the split off valence band in the emitter is populated by high-energy ballistic holes injected through the barrier from the hole accumulation layer on the p-type side of the structure.…”
mentioning
confidence: 71%