Specular and non-specular x-ray scattering study of SiO<sub>2</sub>/Si structures

Ulyanenkov, A.; Omote, Kazuhiko; Matsuo, Ryuji; Harada, J.; Matsuno, Shinsuke

doi:10.1088/0022-3727/32/12/306

Cited by 8 publications

(6 citation statements)

References 29 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The correlation length of the SiO 2 surface could not be accurately measured by AFM as it is likely similar to the tip radius. A value of ζ SiO2 = 110 Å has been reported in the literature as measured by nonspecular X-ray scattering and is assumed similar in our case. Figure a,b shows selected AFM topographical images of F 16 CoPc films deposited at room temperature on SiO 2 with thicknesses of 56 and 262 Å, respectively.…”

Section: Resultssupporting

confidence: 58%

New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures

et al. 2010

View full text Add to dashboard Cite

In this combined atomic force microscopy and X-ray diffraction study, we explore the microscopic origin of the scaling properties of the growth of organic-organic heterostructures formed here by F 16 CoPc and diindenoperylene (DIP) molecules as representative systems for electron and hole transporting materials. We evaluate the influence of the morphological properties of the first organic layer (DIP) on further temporal evolution of the morphology and structure of F 16 CoPc films. From the derived scaling exponents, we conclude that the morphology evolution is dominated by mound formation. The microscopic origin of such morphology is ascribed to structural changes occurring during the first stages of F 16 CoPc growth as revealed by grazing incidence X-ray diffraction (GIXD). The microstructure of organic materials should be taken into account, the challenging task of modeling growing surfaces and interfaces of organic materials.

show abstract

Section: Resultssupporting

confidence: 58%

New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures

et al. 2010

View full text Add to dashboard Cite

show abstract

“…The thickness of the SAM was measured by X-ray reflectivity . The determined thickness for 1a /Au is 51 Å, indicating the formation of the monolayers (Table ).…”

Section: Resultsmentioning

confidence: 99%

“…The X-ray reflectivity and diffuse scattering measurements were carried out using a high-resolution X-ray diffractometer (Advanced Thin Film X-Ray System ATX-E, Rigaku Corporation) . X-rays with wavelength λ = 1.5405 Å (CuK α 1 ) are generated from a Cu rotating anode (50 kV, 300 mA) and collimated by a parabolic multilayer mirror and monochromator.…”

Section: Methodsmentioning

confidence: 99%

“…The thickness of the SAM was measured by X-ray reflectivity. 34 The determined thickness for 1a/Au is 51 Å, indicating the formation of the monolayers (Table 1). Assuming that the triad molecules are densely packed in the monolayer where the methylene spacer and the triad moiety are aligned at an angle of 30°and 0°from the surface normal, respectively, the thickness of 1/Au is estimated to be 47 Å using the CPK model.…”

Section: Chartmentioning

confidence: 96%

See 1 more Smart Citation

Vectorial Multistep Electron Transfer at the Gold Electrodes Modified with Self-Assembled Monolayers of Ferrocene−Porphyrin−Fullerene Triads

et al. 2000

View full text Add to dashboard Cite

Self-assembled monolayers of ferrocene−porphyrin−C60 triads on gold electrodes were prepared to mimic photosynthetic electron transfer events where efficient conversion of light to chemical energy takes place via the long-lived, charge-separated state with a high quantum yield. Adsorbed amounts of the triads on the gold electrodes, estimated from the charge of the anodic peak of the ferrocene, are comparable to those of the well-ordered porphyrin−alkanethiols and C60−alkanethiols on gold electrodes. The results, together with blocking experiments using a redox probe, indicate that the triad molecules are well-packed with an almost perpendicular orientation on the gold surface. The monolayer thickness obtained using X-ray reflectivity analysis is consistent with the structural model of the monolayer. Photoelectrochemical studies were carried out in a standard three-electrode system using the gold electrodes modified with the self-assembled monolayers of the triads. Stable cathodic photocurrents were observed in the presence of electron carriers such as oxygen and/or methyl viologen in the electrolyte when the modified gold electrodes were illuminated with a monochromic light. A photoinduced multistep electron-transfer mechanism is proposed for the photoelectrochemical cells. Thus, vectorial electron transfer or partial charge transfer occurs from the excited singlet state of the porphyrin to the C60, followed by the successive charge shift from the ferrocene to the porphyrin cation radical, to produce the ferrocene cation radical and the C60 anion radical. The C60 anion radical gives an electron to the counter electrode via the electron carriers in the electrolyte solution, whereas electron transfer takes place from the gold electrode to the ferrocene cation radical, resulting in the recovery of the initial state and the generation of the overall electron flow. The artificial photosynthetic cells show the highest quantum efficiency (20−25%) ever reported for photoinduced multistep electron transfer at monolayer-modified metal electrodes and across artificial membranes using donor−acceptor linked molecules. The result indicates clearly that C60 acts as an excellent electron acceptor as well as an electron mediator in artificial photosynthetic membranes. The molecule-based methodology will provide a new direction for the development of solar energy conversion and molecular devices.

show abstract

“…Grazing incidence x-ray reflectometry is a nondestructive technique which provides a powerful method to carry out structural analysis of various materials, [3][4][5][6][7][8][9][10][11][12] but only some studies were related to polymeric materials. [13][14][15] By varying the incidence angle, samples can be probed on thickness going from atomic scale to few micrometers.…”

Section: Introductionmentioning

confidence: 99%

Towards a structural characterization of an epoxy based polymer using small-angle x-ray scattering

Medhioub¹,

Zerrouki

Fourati

et al. 2007

Journal of Applied Physics

View full text Add to dashboard Cite

show abstract

Specular and non-specular x-ray scattering study of SiO₂/Si structures

Cited by 8 publications

References 29 publications

New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures

New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures

Vectorial Multistep Electron Transfer at the Gold Electrodes Modified with Self-Assembled Monolayers of Ferrocene−Porphyrin−Fullerene Triads

Towards a structural characterization of an epoxy based polymer using small-angle x-ray scattering

Contact Info

Product

Resources

About

Specular and non-specular x-ray scattering study of SiO2/Si structures

Cited by 8 publications

References 29 publications

New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures

New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures

Vectorial Multistep Electron Transfer at the Gold Electrodes Modified with Self-Assembled Monolayers of Ferrocene−Porphyrin−Fullerene Triads

Towards a structural characterization of an epoxy based polymer using small-angle x-ray scattering

Contact Info

Product

Resources

About

Specular and non-specular x-ray scattering study of SiO₂/Si structures