Speed-path analysis for multi-path failed latches with random variation

Ishida, Tsutomu; Nitta, Izumi; Homma, Koki; Kanazawa, Yuzi; Komatsu, Hiroaki

doi:10.1109/isqed.2012.6187547

Cited by 1 publication

(3 citation statements)

References 15 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Likelihood selection is a combinatorial optimization process developed in [16] for speed-path analysis. In speed-path analysis, there is an ambiguity that a failing path, a path causing a FF to fail, is unclear.…”

Section: A Likelihood Selectionmentioning

confidence: 99%

“…There are many feature ranking methods [14][15][16]. In this work, we calculate an importance Sort NETS in descending order with the value of item; 7:…”

Section: E Feature Rankingmentioning

confidence: 99%

“…Although the authors in [1] proposed a method for handling the pseudo-faults, the method needs hundreds of failure reports to be efficient. In this work, to diminish the noise of the pseudo-faults and the random faults, we apply three modeling techniques: likelihood selection [16], regression learning using epsilon-support vector regression ( -SVR) [17] and a grouping method. Likelihood selection, a combinatorial optimization technique, selects the most likely fault from among fault candidates in each failure report.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production

Ishida

Nitta

Banno

et al. 2014

2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)

Self Cite

View full text Add to dashboard Cite

This work focuses on volume diagnosis for identifying systematic faults in lower-yield wafers, whose yields are lower than baseline level due to systematic faults during mass production. We develop a model-based volume diagnosis method. To diagnose accurately using the fail data with one lower-yield wafer, we apply modeling techniques for handling pseudo-faults and random faults in the fail data. Experimental results show our method s efficiency; we succeeded in identifying the failure layer for 20/22 data sets with actual lower-yield wafers.

show abstract

Section: A Likelihood Selectionmentioning

confidence: 99%

“…There are many feature ranking methods [14][15][16]. In this work, we calculate an importance Sort NETS in descending order with the value of item; 7:…”

Section: E Feature Rankingmentioning

confidence: 99%