Spherical polystyrene particle deformation measured with the AFM

Abstract

Size measurements of sub-micrometre spherical particles are quite easily performed with an atomic force microscope. The diameter is typically evaluated as the apex of the particle relative to a flat surface. However, some interaction effects may modify the expected results, such as the adhesive forces between the particle and the substrate or the tip–particle interface. In this paper, both effects were experimentally investigated for polystyrene particles with sizes ranging from 150 nm to 700 nm deposited on mica. Additionally, the experimental findings were compared with theoretical models of adhesion, describing both elastic and plastic deformation at the particle–substrate interface. While no clear indication of particle deformation due to the tip–particle interaction was obtained, the deformation due to adhesive forces between the particle and the substrate could be quantified. Contrary to certain theoretical models, the deformation was found to be proportional to the particle size.

Tip–sample characterization in the AFM study of a rod-shaped nanostructure

“…The calculated deformations are summarized in table 1, and it should be noted that the parameters Y, w a and E TMV have an important influence on the calculated deformation [65].…”