2011
DOI: 10.1080/00222348.2011.597693
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Spherulitic Growth of Poly (Ether Ether Ketone) Crystallized at High Pressure

Abstract: High-pressure crystallized poly (ether ether ketone) (PEEK) samples were prepared with a piston-cylinder apparatus by varying temperature, pressure, crystallization time, and molecular weight, and were investigated using wide-angle X-ray diffraction (WAXD), differential scanning calorimetry (DSC), and scanning electron microscopy (SEM). The applied etching experiments showed that the chemical resistance of the polymer was significantly improved through the high-pressure treatment. The results also revealed tha… Show more

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Cited by 5 publications
(2 citation statements)
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“…For polymers with large, well-developed crystal regions inside (as shown in Figure 5(d)), the scattering phenomenon is relatively strong, and the incident light will be scattered to all directions, resulting in that the integrating sphere that measures reflectivity receiving more energy, and the integrating sphere on the rear side of the sample receives less energy. Among two samples with different crystallinity, the molded product (HC-PEEK), whose crystallinity will be higher and some crystal regions will also occur deformation due to the pressure, 19 is more uneven inside, which will cause the scattering phenomenon to be more notable. Therefore, the reflectance of molded products (HC-PEEK) is slightly higher remelted samples (MC-PEEK), while the transmittance is the opposite.…”
Section: Resultsmentioning
confidence: 99%
“…For polymers with large, well-developed crystal regions inside (as shown in Figure 5(d)), the scattering phenomenon is relatively strong, and the incident light will be scattered to all directions, resulting in that the integrating sphere that measures reflectivity receiving more energy, and the integrating sphere on the rear side of the sample receives less energy. Among two samples with different crystallinity, the molded product (HC-PEEK), whose crystallinity will be higher and some crystal regions will also occur deformation due to the pressure, 19 is more uneven inside, which will cause the scattering phenomenon to be more notable. Therefore, the reflectance of molded products (HC-PEEK) is slightly higher remelted samples (MC-PEEK), while the transmittance is the opposite.…”
Section: Resultsmentioning
confidence: 99%
“…Each of the obtained amorphous PLLA was filled in an aluminum container with an inner diameter of 18 mm and depth of 1 mm. The details of the sample assembly and the pressure and temperature calibrations were the same as those described in previous article . After loading the amorphous sample, the pressure was raised to the predetermined level, and then the temperature was raised to the predetermined level.…”
Section: Methodsmentioning
confidence: 99%