To develop a spin-polarized field emitter with high brightness available at room temperature, spin polarization of Heusler alloy Co 2 MnSi thin film deposited onto a chromium buffer layer on a polycrystalline tungsten needle tip surface was measured with Mott polarization analyzer. Typical electron emission pattern of Co 2 MnSi thin film displayed a mosaic pattern, which consisted of small bright spots, and the substrate plane of the brightest spot was a W(001) facet. Polarization direction obtained from the brightest spot was <110> direction of substrate tungsten which corresponded to a magnetic easy axis of Co 2 MnSi, if the film grew epitaxially on the W(001) plane via the chromium buffer layer. About 30% of spin polarization was obtained from Co 2 MnSi film annealed at 600 K for 2 h.