The unique properties of spin-polarized surface or edge states in topological insulators (TIs) make these quantum coherent systems interesting from the point of view of both fundamental physics and their implementation in low power spintronic devices. Here we present such a study in TIs, through tunneling and noise spectroscopy utilizing TI/Al 2 O 3 /Co tunnel junctions with bottom TI electrodes of either Bi 2 Te 3 or Bi 2 Se 3 . We demonstrate that features related to the band structure of the TI materials show up in the tunneling conductance and even more clearly through low frequency noise measurements. The bias dependence of 1/f noise reveals peaks at specific energies corresponding to band structure features of the TI. TI tunnel junctions could thus simplify the study of the properties of such quantum coherent systems that can further lead to the manipulation of their spin-polarized properties for technological purposes. A topological insulator (TI) is a material which is insulating in the bulk but presents spin-dependent conducting edge or surface states which are protected by time-reversal symmetry.1-3 A 2D or 3D TI presents edge or surface states, respectively, which are spin-polarized in-plane, and locked at right angles to the carrier momentum, so that electrons with spin-up/down propagate in opposite directions. The edge or surface states of a TI consist of an odd number of massless Dirac cones. These properties along with their high mobility make TI materials interesting for next generation, low dissipation, and spintronic applications 4,5 in which the electron spins are manipulated even without any magnetic fields. The experimental surge regarding these materials occurred with the prediction of Bi-based TIs 6 and their posterior experimental realization.7 Bi 2 Se 3 and Bi 2 Te 3 , in particular, became the prototypical TI materials that were studied most heavily.To date, the experimental verification of the band structure of TI materials has been predominantly carried out by angle-resolved photoemission spectroscopy (ARPES), which yields energy-momentum graphs of band dispersion for probing depths of under a few nm. 7,8 Also, the use of spin-ARPES has allowed the determination of the spin dependence of the topological surface states. 9 On the other hand, the use of scanning tunneling microscope (STM) allows obtaining information regarding the local density of states (DOS) and the topography of surfaces. By the study of quasiparticle scattering with STM, bands can be mapped very close to the Fermi surface, with a considerably lower energy range and at a smaller scale than with ARPES. [10][11][12][13] Although immensely useful, these techniques are usually cumbersome and the conditions of study are far from a practical application of TIs. A versatile and relatively simple technique to determine the DOS of TI materials could be the study of electronic transport and noise through planar tunneling devices. So far, individual or heterostructure devices with TI layers have mainly dealt with lateral electro...