2017
DOI: 10.1103/physrevb.95.115302
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Spin relaxation through lateral spin transport in heavily doped n -type silicon

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Cited by 39 publications
(47 citation statements)
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“…Finally, we compare our data to previous work on non-local spin-transport devices, specifically, by Suzuki et al 12 who first reported non-local spin transport in Si devices up to room temperature, and by Ishikawa et al 16 , who only very recently published data with, to the best of our knowledge, the largest non-local spin signals for degenerately-doped Si to date. We compare the published experimental data 12,16 of the spin signals converted into a spin-RA product (units of Ωµm 2 ), instead of previously extracted values of ∆µ or P , in order to make the comparison insensitive to differences in the theoretical analysis used to extract parameters from the data. The comparison, displayed in Fig.…”
Section: E Role Of Injector Width and Spin-diffusion Lengthsupporting
confidence: 67%
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“…Finally, we compare our data to previous work on non-local spin-transport devices, specifically, by Suzuki et al 12 who first reported non-local spin transport in Si devices up to room temperature, and by Ishikawa et al 16 , who only very recently published data with, to the best of our knowledge, the largest non-local spin signals for degenerately-doped Si to date. We compare the published experimental data 12,16 of the spin signals converted into a spin-RA product (units of Ωµm 2 ), instead of previously extracted values of ∆µ or P , in order to make the comparison insensitive to differences in the theoretical analysis used to extract parameters from the data. The comparison, displayed in Fig.…”
Section: E Role Of Injector Width and Spin-diffusion Lengthsupporting
confidence: 67%
“…In this geometry, one ferromagnetic contact is used as injector to induce a spin accumulation in the semiconductor channel, and the spin accumulation is detected using a second ferromagnetic electrode placed close to the point of injection at a distance comparable to or smaller than the characteristic spin-transport length (the spin-diffusion length, given by L SD = √ D τ s , where D is the diffusion constant). Indeed, using such non-local devices, the electrical injection, transport and detection of spins in heavily-doped n-type silicon have been achieved [10][11][12][13][14][15][16][17] , including at room temperature. Unfortunately, the induced spin accumulation was very small and the detected spin signals (in the µV range) are about two orders of magnitude smaller than expected.…”
Section: Introductionmentioning
confidence: 99%
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“…In the so-called nonlocal spin transport devices 19,20 , one employs a four-terminal measurement configuration in which one ferromagnetic contact is biased in order to induce a spin accumulation in the nonmagnetic channel, whereas the second ferromagnetic contact, the spin detector, remains unbiased. The spin signals observed in such nonlocal devices with tunnel contacts [21][22][23][24][25][26][27][28][29] are well described by the theory for spin injection and detection in the linear response regime 13,30 . Consequently, nonlocal devices have been instrumental to prove and understand spin injection and transport in a wide variety of materials, although they are of little direct technological relevance.…”
Section: Introductionmentioning
confidence: 76%
“…We propose that the length scale for Rashba spin-orbit coupling can be as large as the spin diffusion length in semiconductor or normal metal, which is supported by the observed experimental results. The observed Rashba effect may challenge the non-local spin transport measurement [1,3,40] in Si since Rashba effect may enhance the spin polarization.…”
Section: Inversionmentioning
confidence: 97%