1999
DOI: 10.1103/physrevb.59.14516
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Spin reorientations induced by morphology changes in Fe/Ag(001)

Abstract: By means of magneto-optical Kerr effect we observe spin reorientations from in-plane to out-ofplane and vice versa upon annealing thin Fe films on Ag(001) at increasing temperatures. Scanning tunneling microscopy images of the different Fe films are used to quantify the surface roughness. The observed spin reorientations can be explained with the experimentally acquired roughness parameters by taking into account the effect of roughness on both the magnetic dipolar and the magnetocrystalline anisotropy. 75.70.… Show more

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Cited by 44 publications
(20 citation statements)
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“…Also, evidence was found for some degree of Ag Fe intermixing. The cluster formation was observed by STM on 4.5 ML thick Fe deposited on a Ag layer grown on GaAs substrate [30]. Cluster formation of Fe on Ag may also be expected because of the diffusion mediated adatom capture, as was observed even for Fe homoepitaxy on Fe(1 0 0) [31].…”
Section: Discussionmentioning
confidence: 89%
“…Also, evidence was found for some degree of Ag Fe intermixing. The cluster formation was observed by STM on 4.5 ML thick Fe deposited on a Ag layer grown on GaAs substrate [30]. Cluster formation of Fe on Ag may also be expected because of the diffusion mediated adatom capture, as was observed even for Fe homoepitaxy on Fe(1 0 0) [31].…”
Section: Discussionmentioning
confidence: 89%
“…After the growth process, the films were annealed at 150°C for 30 min in order to improve the surface morphology. 9,10 To avoid contamination during the measurements, most samples were capped with a 5 ML thick Au layer. The magnetic anisotropy was probed by the in situ longitudinal ͑inci-dence angle 21°͒ and polar ͑incidence angle of 69°to the sample normal͒ magneto-optical Kerr effect ͑MOKE͒ with a laser diode of wavelength 670 nm and beam diameter Ͻ0.2 mm.…”
Section: Methodsmentioning
confidence: 99%
“…There are different methods for the anisotropy engineering, changing, e.g. : (i) magnetic film thickness, d [1]; (ii) temperature [2][3][4]; (iii) buffer morphology, roughness [5][6][7]; (iv) film structure [8,9] or structure of the cover layer [10][11][12]; (v) composition [13,14]; (vi) surface-interface roughness [15]. The reorientation phase transition (RPT) from easy magnetization plane into easy magnetization axis can be realized.…”
mentioning
confidence: 99%