Split Mach–Zehnder interferometer for surface plasmon resonance based phase modulation

Banerjee, Jayeta; Bera, Mahua; Ray, Mina

doi:10.1016/j.optcom.2017.07.008

Cited by 6 publications

(1 citation statement)

References 17 publications

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“…In order to improve the resolution and sensitivity of SPR sensors, phase modulation schemes have been proposed which dependent on the phase of transverse magnetic (TM) polarized component has a tremendous variation but transverse electric (TE) polarized one has a little change, and in large number of literatures which reported that phase mode can enhance the sensitivity of SPR sensors by 2 orders of magnitude as well [15][16][17] . In this paper, SPR phase difference data at a fixed wavelength in multiple incident angles are used to solve the inverse problem for multilayers system.…”

Section: Introductionmentioning

confidence: 99%

Determination of bimetallic film’s thickness and optical constants based on SPR phase detection

Yue

Ding

Tao

et al. 2023

AOPC 2022: Optoelectronics and Nanophotonics

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A method for solving bimetallic film coefficients using surface plasmon resonance (SPR) phase difference experimental data with fixed wavelength and multiple incident angles is presented to simplify and quickly solve the thickness and optical constants of metal films in this paper. The purpose is to extract unknown parameters from the phase difference between P-and S-polarizations of the reflected light occurred at the metal/dielectric interface. The results of bimetallic layer film's thickness and optical constants obtained by our method are in better agreement with that of spectroscopic ellipsometer (SE) measurement method. Therefore, the approach reveals the possibility of retrieving the thickness and optical constants from the measurement results of the phase difference for multilayers, and makes it be a much better option to be employed for further film's parameter analysis applications.

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Section: Introductionmentioning

confidence: 99%