Abstract:The valence band of copper is studied by X-ray emission spectroscopy. The profile of the KP2,5 line is measured by an one-crystal spectrometer taking advantage of a fine focused electron beam and a high-angle Bragg reflection of silicon crystal. The half-width of the CuKP2,5 line is 4.5 eV and there is a splitting of the line. The separation between the two maxima is 2.7 eV. The shortwave slope of the curve is very sharp. It is similar to the emission band of simple metals where the threshold singularities are… Show more
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