“…Our previous and other studies have demonstrated the negative effects of low‐temperature events during the vegetative stage on grain yield in wheat (Barlow, Christy, O'Leary, Riffkin, & Nuttall, ; Ji et al., ; Li, Cai, Liu, Dai et al., ; Li, Pu et al., ). A grain yield loss in a high range of 3%–85% was found under low temperature at jointing and booting stages, which is related to many factors including the level and duration of low temperature, the wheat growth stage when the low‐temperature events occur, and the cold tolerance of wheat cultivars (Craufurd, Vadez, Svk, Pvv, & Zamanallah, ; Ji et al., ; Li, Cai, Liu, Dai et al., ). The PHEF, which occurs during reproductive developmental stages, can result in catastrophic yield loss in wheat; this is because it has a direct effect on the grain filling process (Mushtaq et al., ).…”