2020
DOI: 10.1103/physrevmaterials.4.123402
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Sputter-engineering a first-order magnetic phase transition in sub-15-nm-thick single-crystal FeRh films

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Cited by 4 publications
(5 citation statements)
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“…S2 [32]). This analysis provides S FeRh = 0.817 and S FePt = 0.533, which are consistent with previously reported values for FeRh [12,35] and FePt [36,37] thin films.…”
Section: Experiments Resultssupporting
confidence: 92%
“…S2 [32]). This analysis provides S FeRh = 0.817 and S FePt = 0.533, which are consistent with previously reported values for FeRh [12,35] and FePt [36,37] thin films.…”
Section: Experiments Resultssupporting
confidence: 92%
“…Crystal orientation analysis was carried out by high-resolution x-ray diffraction (XRD). The XRD patterns were in agreement with the ones reported earlier [36]. BLS spectra were recorded in the backscattering configuration using a Sandercocktype (3 + 3)-pass tandem Fabry-Pérot interferometer.…”
Section: Methodssupporting
confidence: 87%
“…S2 of the Supplementary Information), which allows the crystallographic order parameter S to be calculated (details in the supplementary information). This analysis yields S = 0.81, which is comparable to values found for FeRh deposited on MgO elsewhere 31 , 40 , indicating a high degree of ordering in the FeRh thin film.
Figure 1 ( a ) XRD data for a ∼ 20 nm FeRh thin film fabricated onto an [001]-oriented PMN 28 -PT 72 single crystal substrate.
…”
Section: Resultssupporting
confidence: 76%