2015
DOI: 10.1016/j.nimb.2015.03.060
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Sputter-pits casting to measure AMS sample consumption

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Cited by 8 publications
(5 citation statements)
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“…We confirm the effect discovered by Shanks and Freeman (2015) that sample wells in metals with low EA increase C – ion currents at small well ⌀ over Al. We used solid metal inserts, while they press powder in a recess into which they drill the sample well.…”
Section: Discussionsupporting
confidence: 90%
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“…We confirm the effect discovered by Shanks and Freeman (2015) that sample wells in metals with low EA increase C – ion currents at small well ⌀ over Al. We used solid metal inserts, while they press powder in a recess into which they drill the sample well.…”
Section: Discussionsupporting
confidence: 90%
“…The amount of competitive ionization from Al 2 depends on the primary Cs focus, ~2 mm behind the sample holder surface in our case, and the width of the primary beam, found to be 1.2 mm by the fits in Figure 5a. The “pit casting” done by Shanks and Freeman (2015) show their focus to be 1 mm deeper than the surface, allowing excess Al sputtering. Location of the primary focus at the well entrance (Han et al 2007) has three advantages: maximal impact of the Cs + on the sample for all sample ⌀, erosion of the sample in a ring pattern (keeping the maximum of the ion beam on axis), and minimizing sputtering of the holder material.…”
Section: Discussionmentioning
confidence: 99%
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