2020
DOI: 10.1134/s1063785020120226
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Sputtering of Tungsten by Beryllium and Neon Ions

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Cited by 7 publications
(4 citation statements)
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“…Traditional models of sputtering are inapplicable in the considered case of bombardment of a target by light particles. The sputtering of surface layers by a flux of backscattered particles is dominant in this instance [1]. The values provided by the Sigmund model [2] are five times higher than the experimental ones.…”
mentioning
confidence: 69%
See 1 more Smart Citation
“…Traditional models of sputtering are inapplicable in the considered case of bombardment of a target by light particles. The sputtering of surface layers by a flux of backscattered particles is dominant in this instance [1]. The values provided by the Sigmund model [2] are five times higher than the experimental ones.…”
mentioning
confidence: 69%
“…Threshold energy values with sputtering yields tending to zero are of interest. A model well-suited for nearthreshold energies, where surface atoms are sputtered by a flux of backscattered bombarding particles, was examined in our study [1]. The energy transferred to a surface atom in this case is…”
mentioning
confidence: 99%
“…In addition to the study of the atoms passage through amorphic targets, the channeling phenomenon modeling was also performed in crystals. The distributions of runs of the D atoms in W(100) were also calculated at different initial energies [21] and angles of incidence. Fig.…”
Section: Atoms Passage Through a Crystalchanneling Modementioning
confidence: 99%
“…A careful study of the energy distributions of the ions scattered by the crystal surface and the character of the one-time scattering maximum's decay showed the presence of ions with energies greater than the energies of the one-time scattered ions in the spectra. It has been suggested that the presence of such ions in the spectra is due either to simultaneous collisions of the ion with several target atoms or to sequential and in particular, multiple collisions of the ion with target atoms [4,5]. If the thickness of the target is much less, than the total range of incident, ions and ionization losses in the substance can be neglected, then such a target is called thin.…”
Section: Introductionmentioning
confidence: 99%