We propose a novel design of an ultra-low power radiation-hardened single-ended (UPRHSE) SRAM bit-cell using the GAA CNT-GDI method. In the structure of bit-cell to improve read-/hold-stability and expand write-ability several schemes have been used such as asymmetric virtual ground gating, built-in read-assist and the multi-diameter/chirality for CNTs. Also, to investigate single/double upsets, injection circuit model using the structure of the T-connected pseudo resistors is proposed. The results of extensive Monte-Carlo simulations to evaluate the proposed bit-cell indicate larger noise margins, acceptable yield, less sensitivity to PVT variations, and higher critical charge. Moreover, the suggested bit-cell has more robustness to soft errors with high reliability of data storage in the presence of critical voltage conditions, and better results in other comprehensive figures of merit as compared to state-of-the-art bit-cells in the 16 nm technology. Finally, the proposed bit-cell in a real application is used to store data from two-layer quick-response code-based in terrestrial environments. The results show better performance of the bit-cell in terms of a comprehensive FoM, which provides more effective trade-off between the hardware efficiency and quality metrics to evaluate the appropriate accuracy in the pixel-by-pixel image as compared to other well-known counterpart designs.