One distinguished property of topological insulator (TI) is its robust quantized edge conductance against edge defect. However, this robustness, underlined by the topological principle of bulk-boundary correspondence, is conditioned by assuming a perfect bulk. Here, we investigate the robustness of TI phase against bulk defects, including vacancy (VA), vacancy cluster (VC), and grain boundary (GB), instead of edge defect. Based on a tight-binding model analysis, we show that a 2D TI phase, as characterized by a non-zero spin Bott index, will vanish beyond a critical VA concentration (n c v ). Generally, n c v decreases monotonically with the decreasing topological gap induced by spin-orbit coupling. Interestingly, the n c v to destroy the topological order, namely the robustness of the TI phase, is shown to be increased by the presence of VC but decreased by GB. As a specific example of large-gap 2D TI, we further show that the surface-supported monolayer Bi can sustain a nontrivial topology up to n c v ~ 17%, based on a densityfunctional-theory-Wannier-function calculation. Our findings should provide useful guidance for future experimental studies of effects of defects on TIs.