Transparent conductive
oxides such as indium tin oxide (ITO) are
standards for thin film electrodes, providing a synergy of high optical
transparency and electrical conductivity. In an electrolytic environment,
the determination of an inert electrochemical potential window is
crucial to maintain a stable material performance during device operation.
We introduce operando ellipsometry, combining cyclic voltammetry (CV)
with spectroscopic ellipsometry, as a versatile tool to monitor the
evolution of both complete optical (i.e., complex refractive index)
and electrical properties under wet electrochemical operational conditions.
In particular, we trace the degradation of ITO electrodes caused by
electrochemical reduction in a pH-neutral, water-based electrolyte
environment during electrochemical cycling. With the onset of hydrogen
evolution at negative bias voltages, indium and tin are irreversibly
reduced to the metallic state, causing an advancing darkening, i.e.,
a gradual loss of transparency, with every CV cycle, while the conductivity
is mostly conserved over multiple CV cycles. Post-operando analysis
reveals the reductive (loss of oxygen) formation of metallic nanodroplets
on the surface. The reductive disruption of the ITO electrode happens
at the solid–liquid interface and proceeds gradually from the
surface to the bottom of the layer, which is evidenced by cross-sectional
transmission electron microscopy imaging and complemented by energy-dispersive
X-ray spectroscopy mapping. As long as a continuous part of the ITO
layer remains at the bottom, the conductivity is largely retained,
allowing repeated CV cycling. We consider operando ellipsometry a
sensitive and nondestructive tool to monitor early stage material
and property changes, either by tracing failure points, controlling
intentional processes, or for sensing purposes, making it suitable
for various research fields involving solid–liquid interfaces
and electrochemical activity.