“…Seebeck value of the TE elements was measured using vacuum‐assisted custom built apparatus that is reported previously in detail in our earlier works. [
15,21 ] Four‐point probe method was used to measure electrical resistivity of the TE materials, in which Keithley SMU 2634B was used for sourcing current in outer two probes and measuring voltage in inner two probes using the formula
, where, s was the distance between the two consecutive probes. [
22 ] The resistivity ρ was divided with correction factor C = (2s T −1 ) ln2 to obtain corrected value of ρ (correction due to finite sample dimension), where T is thickness of the sample.…”