1997
DOI: 10.1039/a701037k
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Stacking faults in the structure of nickel hydroxide: a rationale of its high electrochemical activity

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Cited by 154 publications
(138 citation statements)
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“…Structural disorder in Ni(OH) 2 can provide an easier path for the diffusion of protons within the NiO layers and can help lower the free energy by increasing the entropy, which can in turn increase the electrochemical reaction rate [10,12]. Previous reports have indicated that the peak (1 0 l) was especially broad when the nickel hydroxide was more active [34,35]. It is obvious that sample A shows a broader FWHM of the (1 0 1) diffraction line of 1.057, whereas the value for spherical sample B is 0.782, indicating that non-spherical powders possess a higher density of structural disorder and a better electrochemical activity in spite of its larger particle size.…”
Section: Xrdmentioning
confidence: 99%
“…Structural disorder in Ni(OH) 2 can provide an easier path for the diffusion of protons within the NiO layers and can help lower the free energy by increasing the entropy, which can in turn increase the electrochemical reaction rate [10,12]. Previous reports have indicated that the peak (1 0 l) was especially broad when the nickel hydroxide was more active [34,35]. It is obvious that sample A shows a broader FWHM of the (1 0 1) diffraction line of 1.057, whereas the value for spherical sample B is 0.782, indicating that non-spherical powders possess a higher density of structural disorder and a better electrochemical activity in spite of its larger particle size.…”
Section: Xrdmentioning
confidence: 99%
“…The substitution of nickel sites with cobalt atoms improves the proton conductivity of β-Ni(OH) 2 . It is unclear, however, whether this is attributable to increased proton vacancies [42] or to increased stacking fault disorder, which is also known to affect the electrochemical activity of nickel hydroxide electrodes [43][44][45]. Therefore, it is important that all possible forms of disorder should be identified.…”
Section: Greater If the Interlayer Space Contains Anionic Impurities mentioning
confidence: 99%
“…Stacking faults cause selective line broadening in XRD patterns, because the disorder is only along the direction of the crystallographic c-axis (i.e. order within the ab-plane is unaffected by stacking faults) [43,45,57]. The relationship between stacking fault frequency and powder XRD peak widths and intensities has been simulated computationally [44,59].…”
Section: (I) Hydrationmentioning
confidence: 99%
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“…The AC layer with the generalized composition [MX 2 ] is found in a very diverse range of materials such as metal sulfides MS 2 (M = Ti, Mo, Nb, Ta), [21,22] metal selenides MSe 2 (M = Mo, Ta), [23] divalent halides MX 2 (M = Ca, Mg, Fe, Co, Ni, Cd), [24,25] metal hydroxides M(OH) 2 (M = Mg, Ni, Co), [26,27] birnessite-type oxides MO 2 (M = Mn), [28,29] lithium oxides LiMO 2 [30,31] and basic salts M(OH) 2-x A x (M = Ni, Co; x = 0.66-0.25; A = Cl, NO 3 ). [32][33][34] We therefore call the AC layer a 'structural synthon', the term "structural" is used to describe the extended nature of the AC layer, as opposed to the sub.-molecular synthon originally proposed by Corey [35] and the supramolecular synthon of Desiraju [36,37] which are entities of finite dimension.…”
Section: Structural Synthon Approach To Predicting the Polytypesmentioning
confidence: 99%