1998
DOI: 10.1017/s0885715600009891
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Standardless quantitative mineralogical analysis of rocks

Abstract: The main difficulty in the quantitative mineral analysis of rocks is connected with the variable nature of the mineral species. In the present paper a combined method (and a corresponding computer program) is proposed, which practically overcomes this difficulty. This method is based on linear equations, which are a combination of the chemical mass-balance equations with those of the quantitative X-ray diffractometry, and can perform (completely or partly) both the quantification and the chemical characterizat… Show more

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Cited by 3 publications
(3 citation statements)
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“…The mineralogical composition in clay samples (Table 2), was determined by X-ray diffraction analyses, and the quantitative analyses was obtained by the method described by Bayliss [9] and Zangalis [10]. From the quantitative X-ray analysis the following minerals were found to be present and the results from three locations are shown on Table 2.…”
Section: The Mineralogical Analysis Of Clay Fractionmentioning
confidence: 99%
“…The mineralogical composition in clay samples (Table 2), was determined by X-ray diffraction analyses, and the quantitative analyses was obtained by the method described by Bayliss [9] and Zangalis [10]. From the quantitative X-ray analysis the following minerals were found to be present and the results from three locations are shown on Table 2.…”
Section: The Mineralogical Analysis Of Clay Fractionmentioning
confidence: 99%
“…(a) Standardless analysis methods based on X-ray data only (MOORE, 1965;SALYN & DRITS, 1972;ZEVIN, 1977;FIALA, 1980;STARKS et al, 1984;FANG and ZEVIN, 1985;RIUS et al 1987;BISH and POST, 1993;ESTEVE et al, 1997b;ZANGALIS, 1998). Below are presented two different cases of these methods, described for quantitative X-ray analysis.…”
Section: Introductionmentioning
confidence: 99%
“…Below are presented two different cases of these methods, described for quantitative X-ray analysis. (b) Standardless methods based on chemical and X-ray data simultaneously (ZANGALIS, 1991(ZANGALIS, , 1998STARKS et al, 1984;WANG & PU, 1991). Here the number of phases is considered to be given and one or more nonoverlapping reflections correspond to each phase.…”
Section: Introductionmentioning
confidence: 99%