Monolayer epitaxial graphene grown on 6H-SiC(0001), was recently investigated by grazing incidence fast atom diffraction and analyzed with ab initio electronic density calculation and with exact atomic diffraction methods. With these results as a reference, the hard corrugated wall model (HCW) is used as a complementary analytic approach to link binary potentials to the observed atomic corrugation. The main result is that the HCW model reproduces the macroscopic corrugation of the Moiré pattern on a quantitative level suggesting that softwall corrections may be neglected for macroscopic superstructures allowing straightforward analysis in terms of a 1D corrugation function.