“…With scaling down of the feature size of chips, field programmable gate arrays (FPGAs) and ASIC are more susceptible to the effects of ionizing irradiation, especially SEUs, which seriously threaten the reliability of circuits [1,2,3]. To reduce impacts of SEUs, triple modular redundancy (TMR), a highly efficient mitigation technique, is the most used method [4,5,6]. Metastability caused by CDC is an another problem which threaten the reliability of circuits.…”