2021 IEEE Energy Conversion Congress and Exposition (ECCE) 2021
DOI: 10.1109/ecce47101.2021.9595593
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Static and Dynamic Characterization of 650 V GaN E-HEMTs in Room and Cryogenic Environments

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Cited by 8 publications
(3 citation statements)
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“…To reach the desired blocking voltage, V DC , the R DS(ON) of the switches are scaled based on their maximum V DS as per, N series > V DC V DS(MAX) (20) where N series is the number of switches needed in series to reach the desired V DC . Similarly, to meet the output current requirement, I o , of the inverter, R DS(ON) is scaled based on each switches maximum I DS as per, N parallel > I DS I DS(MAX) (21) where N parallel is the number of parallel switches needed. The scaled resistance for an effective switch is calculated using,…”
Section: Theoretical Motor Drive Case Studymentioning
confidence: 99%
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“…To reach the desired blocking voltage, V DC , the R DS(ON) of the switches are scaled based on their maximum V DS as per, N series > V DC V DS(MAX) (20) where N series is the number of switches needed in series to reach the desired V DC . Similarly, to meet the output current requirement, I o , of the inverter, R DS(ON) is scaled based on each switches maximum I DS as per, N parallel > I DS I DS(MAX) (21) where N parallel is the number of parallel switches needed. The scaled resistance for an effective switch is calculated using,…”
Section: Theoretical Motor Drive Case Studymentioning
confidence: 99%
“…In such a powertrain the temperature of the power electronics would be cryogenic (<−150 • C). At these temperatures silicon-carbide (SiC) FETs [12][13][14] and IGBTs [15,16] tend to have an increase in conduction losses due to a higher R DS(ON) while silicon (Si) FETs [17,18] and gallium nitride (GaN) high electron mobility transistors (HEMTs), [19][20][21][22][23][24] have reduced conduction losses. However, carrier freezeout limits the R DS(ON) reductions of Si devices in comparison to GaN devices.…”
Section: Introductionmentioning
confidence: 99%
“…62, Page: 6]. E-HEMTs offer reduced static R DS,on , constant V Th and reduced switching energy losses under cryogenic conditions[50][51][53][54][56]. Carrier freeze-out as a limitation could not be observed in the publication[54, Page: 7413].…”
mentioning
confidence: 99%