Statistical and Probabilistic Analysis of Thermal-Fatigue Test Data Generated Using V-Shape Specimen Testing Method

Abstract

V-shape specimen testing is a relatively new, simple and useful technique to characterize the thermal-fatigue resistance of materials subjected to combined thermal/mechanical loadings, and to rank and select materials. However, the V-shape specimen test data, similar to many other life test data, always contain an inherent scatter not only because of material non-uniformity but also of the difficulties in operating control, such as loading, boundary conditions, and environment. Therefore, statistical and probabilistic approaches have to be used to interpret the test data in order to implement the observations into new product designs. In this paper, the V-shape specimen test data are selected, analyzed and the scatter properties of the test data are fitted using several continuous probability distribution functions. The results are compared, and the root failure mechanisms of the V-specimens are also discussed. Finally, the main observations are summarized, and a recommendation is provided.