2020
DOI: 10.1049/iet-cds.2019.0366
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Statistical compact model extraction for skew‐normal distributions

Abstract: A technique to extract statistical model parameters for skewed Gaussian process variations is proposed. Statistical compact model extraction traditionally assumes that underlying process variations are Gaussian in nature. ON currents in certain high voltage technologies, which are linear in process deviations, show skew in their distribution and hence is indicative of skew in the underlying process variations. The use of skew-normal random variables is proposed to model such variations. Artificial neural netwo… Show more

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Cited by 2 publications
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