Statistical design characterization of analog circuits

Luk, Timwah; Potts, D.C.

doi:10.1109/icsict.2008.4734908

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2010

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“…Although the bulk of the circuitry in a commercial microprocessor is digital, there are a few very important analog blocks which also need to have healthy yields if the product is to be successful in the marketplace. The implications of increasing random variation have been discussed previously [5] and there have been studies that illustrate the importance of analog design for variability and yield [6][7][8].…”

Section: Introductionmentioning

confidence: 99%

Thermal sensor variation reduction in deep sub 100nm process technologies

2010

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As technology scales, the impact of process variation to device and circuit performance has increased significantly. The presented statistical design approach illustrates the importance of pre-silicon circuit performance characterization under random variation stress. The measured data shows that by applying sound analog layout rules, actual variation can be reduced by 30% and that compensation techniques like chopping for amplifier offset cancellation and current source mismatch reduction are effective in lowering variation further by up to 55%. The choice between the static and dynamic application of these techniques is also discussed.I.

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