2014
DOI: 10.1093/jmicro/dfu001
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Statistical distribution of single atoms and clusters of supported Au catalyst analyzed by global high-resolution HAADF-STEM observation with morphological image-processing operation

Abstract: We have developed a quantitative particle size analytical method at the single atomic level employing electron microscopy and image processing for the investigation of supported metal catalysts. In the present study, a supported gold (Au) catalyst containing sub-nano clusters and individual atoms was globally observed by high-resolution high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) using spherical aberration (Cs)-corrected TEM. To fully extract structural information of t… Show more

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Cited by 18 publications
(7 citation statements)
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“…) even at the atomic level for very small clusters (Yamamoto et al . ) or on probabilistic models (Fisker et al . ) can give reliable results.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…) even at the atomic level for very small clusters (Yamamoto et al . ) or on probabilistic models (Fisker et al . ) can give reliable results.…”
Section: Introductionmentioning
confidence: 99%
“…Most of the time, the measured NPs are dispersed on a homogeneous background (Fisker et al 2000;Eustis et al 2005;Li & Zuo 2005;Cervera Gontard et al 2006;Karlsson et al 2006). In this case, common automatic segmentation methods based on the global grey level of images (Cervera Gontard et al 2006), morphological image-processing operations (Eustis et al 2005) even at the atomic level for very small clusters (Yamamoto et al 2014) or on probabilistic models (Fisker et al 2000) can give reliable results. But when the systems or micrographs are more complex, such as near-coalescence or overlapping NPs (Li et al 2007;Park et al 2013;Muneesawang & Sirisathitkul 2015) or small size NPs imaged in high resolution TEM (HRTEM) on a carbon film, where the background ground affected by the defocusing conditions affects the measurements (Pyrz & Buttrey 2008), dedicated algorithms or measurement methods must be used.…”
Section: Introductionmentioning
confidence: 99%
“…35 This microscopic perspective can induce bias (unintentional or intentional) in both image selection and species analysis. 36 The ability to extract accurate coordinates of metal centers in SACs comprises a crucial step toward bulk statistics, permitting the extraction of materials descriptors that provide information about the metal dispersion uniformity with a far superior significance to estimations based on manual analysis.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…With aberration correction, imaging of Au clusters at the atomic resolution is now possible. [ 230 ] Information that can be obtained from TEM and STEM imaging includes particle size, shape, lattice fringe, crystallographic structure, defects, and grain boundaries.…”
Section: Characterization Of Au Clustersmentioning
confidence: 99%